CHEG 672 Materials Characterization
This course introduces graduate students to advanced concepts of analytical materials characterization methods emphasizing the most common applications and limitations of each method. It covers the use of materials characterization techniques for both bulk- and thin-film characterization. Students will learn the principles, instrumentation and operation of X-ray diffraction (XRD), scanning/transmission electron microscopy (SEM/TEM), x-ray photoelectron spectroscopy (XPS), FTIR and Raman Spectroscopy, and thermal analysis using DTA and DSC. The student will gain an understanding of the importance of these tools in designing and solving materials-related problems.
Distribution
3-0-3Offered
Spring