NUCE 786 Materials Characterization Techniques
This course introduces the different materials characterization
techniques to determine atomic structure, morphology and
physical properties of the engineering materials. The selection
process of the most suitable characterization method for a certain
application of materials is also discussed. The common advanced
techniques covered in this course are electron microscopy (SEM
and TEM with principles of bright-field, dark-field and weak beam imaging), Scanning Tunneling Microscopy (STM) and
Atomic Force Microscopy (AFM), thermal analysis (DSC, TGA),
X-ray diffractometer (XRD), spectroscopic methods (IR, Raman,
and UV), and chromatographic methods.
Distribution
3-0-3