MSEN 712 Imaging of Materials: Scanning Electron Microscopy and X-ray Microanalysis
This course will study and investigate principles and applications of imaging techniques for materials characterization including scanning electron microscopy and X-ray microanalysis. Topics include: electron optics, electron guns, electron lenses and their aberration, electron specimen interactions, image formation and interpretation, X Ray Spectral Measurement and Quantitative X Ray Analysis, SEM sample preparation including organic and inorganic samples. Lectures are complemented by real-case studies and computer simulations. The course will enable the students to start their SEM practical experience with the SEM training in Quanta 250
Offered
Fall Spring