MSEN 715 Advanced Imaging of Materials: Transmission Electron Microscopy
This course focuses on the principles and applications of transmission electron microscope (TEM). Students choosing this course will learn advanced theory and applications of TEM operation and sample preparation during the semester. Topics include: Electron optics, lens aberrations, depth of field, depth of focus, resolution, contrast, bright and dark field microscopy, selected area diffraction, calibration, specimen preparation, electron scattering, electron diffraction, Bragg's law, Laue conditions, structure factor, Ewald construction, double diffraction, twinning, Kikuchi lines, contrast theory, kinematical theory of diffraction by perfect and imperfect crystals, extinction contours, dynamical theory, special techniques, introduction to HRTEM.
Offered
Fall