MSEN 782 Materials Characterization Techniques
This course introduces the different materials characterization techniques to determine atomic structure, morphology and physical properties of the engineering materials. The selection process of the most suitable characterization method for a certain application of materials is also discussed. The common advanced techniques covered in this course are electron microscopy (SEM and TEM with principles of bright-field, dark-field and weak-beam imaging), Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM), thermal analysis (DSC, TGA), X-ray diffractometer (XRD), spectroscopic methods (IR, Raman, and UV), and chromatographic methods.
Offered
Fall